A Fast and Efficient Blotch Detection Algorithm for Degraded Image Sequences Based on MRF Models

Based on MRF Models Sang-Churl Nam, Masahide Abe and Masayuki Kawamata Department of Electronic Engineering, Graduate School of Engineering, Tohoku University Aoba-yama 6-6-05, Sendai 980-8587, Japan Tel: +81-22-795-7095, Fax: +81-22-263-9169 Abstract: This paper proposes an efficient blotch detection algorithm based on a Markov Random Field (MRF) model with less computational complexity and with lower false alarm rate than the existing MRF-based algorithms. The proposed algorithm can save the computational time for detecting the blotches by restricting the attention of the detection process only to the candidate areas. To solve the problem of confusion with the blotches in the vicinity of the moving object, we incorporate the weighting function with respect to the detected moving edge pixels into the formuation. Experimental result shows that our method can provides the computational simplicity and an efficient detecting performance for the blotches.